相关实验视频

Updated: May 16, 2025

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces
09:33

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

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从使用金属或介电元面的MicroLED产生的增强和定向电光发射

Mohamed S Abdelkhalik1, Xavier Garcia-Santiago2, Thomas-Jan van Raaij1

  • 1Department of Applied Physics and Science Education, Eindhoven Hendrik Casimir Institute, and Institute for Complex Molecular Systems, Eindhoven University of Technology, Eindhoven, The Netherlands.

Communications engineering
|April 5, 2025
PubMed
概括

研究人员使用超表面增强微型发光二极管 (microLED),以提高亮度和控制光方向. 这项创新解决了微LED显示器的低外部量子效率 (EQE) 和兰伯特式排放挑战.

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Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms08:48

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Published on: September 25, 2020

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Enhanced Electron Injection and Exciton Confinement for Pure Blue Quantum-Dot Light-Emitting Diodes by Introducing Partially Oxidized Aluminum Cathode10:41

Enhanced Electron Injection and Exciton Confinement for Pure Blue Quantum-Dot Light-Emitting Diodes by Introducing Partially Oxidized Aluminum Cathode

Published on: May 31, 2018

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相关概念视频

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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