使用多层石墨烯接触器测量两极二维半导体的带隙

Sam Park1, Sungjae Hong1, June Yeong Lim1

  • 1vdWMRC Department of Physics Yonsei University 50 Yonsei-ro Seodaemun-gu Seoul 03722 Korea.

Small science
|April 11, 2025
PubMed
概括

一种新的场效晶体管 (FET) 方法估计了多层二维半导体中的带隙,克服了较厚材料光发光 (PL) 的局限性. 该技术使用多层石墨烯接触器来准确确定范德瓦尔斯半导体中的带隙.

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