,

Mingyu Lee1, Jiwon Lee1, Yewon Shin1

  • 1Department of Energy Science and Engineering Daegu Gyeongbuk Institute of Science and Technology (DGIST) 333 Technojungang-ro, Dalsung-gun Daegu 42988 Republic of Korea.

Small science
|April 11, 2025
PubMed
概括

检测离子电池 (LIB) 中隐藏的缺陷对于安全至关重要. 本综述探讨了非侵入性成像技术,以发现隐藏的缺陷,提高LIB可靠性和防止故障.

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