InGaN

Devki N Talwar1,2, Hao-Hsiung Lin3, Jason T Haraldsen1

  • 1Department of Physics, University of North Florida, 1 UNF Drive, Jacksonville, FL 32224-7699, USA.

概括

本研究介绍了一种半实证方法来分析化 (InxGa1-xN) 超薄膜的光学特性. 该方法准确地预测了组合依赖的能量差距,这对于光子设备开发至关重要.