肝脏四重培养芯片作为辐射伤害研究模型

Yuki Ueda1, Satoshi Omiya1, Jonathan Pinney2

  • 1Radiation Oncology Branch, Center for Cancer Research, National Cancer Institute, 10 Center Drive, Room B3B406, Bethesda, MD, 20892, USA.

Scientific reports
|April 11, 2025
PubMed
概括

一种新型肝芯片模型通过显示DNA损伤和功能障碍,有效模拟辐射诱导性肝病 (RILD). 这种模型还证明了N-乙半胺胺 (NACA) 减轻RILD效应的潜力.