乘数和电荷层对InGaAsSb/AlGaAs雪崩光二极管在室温下的增益的影响
Tetiana Manyk1, Jarosław Rutkowski1, Krzysztof Kłos2
1Institute of Applied Physics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland.
Sensors (Basel, Switzerland)
|April 12, 2025
概括
本研究分析了使用InGaAsSb.的红外 (IR) 屏障雪崩光二极管 (APD). 模拟显示,优化的结构可以实现在室温下SWIR应用的高性能和较低的暗电流.
科学领域:
- 光电学是指光电子产品.
- 半导体设备 半导体设备
- 材料科学 材料科学 材料科学
背景情况:
- 红外 (IR) 屏障雪崩光二极管 (APD) 对于光学检测至关重要.
- 基于InGaAsSb的材料为高性能红外探测器提供了潜力.
- 在实际的SWIR应用中,室温操作是理想的.
研究的目的:
- 从理论上分析npBp IR屏障APD的性能.
- 为了研究InGaAsSb中冲击电离的不同吸收,分级,电荷和乘数 (SAGCM) APDs.
- 为了优化探测器参数以提高增益和减少暗电流.
主要方法:
- 使用Crosslight软件的APSYS包进行理论分析.
- 模拟带结构和电场分布.
- 对冲电离和装置参数的分析.
主要成果:
- 降低电荷层的兴奋剂增加了增益和故障电压,扩大了线性范围,并降低了穿孔电压.
- 增加乘法层宽度可以提高光电流和断裂电压.
- 拟议的结构实现了与以前的InGaAsSb APD相比可比的增益和较低的暗电流.
结论:
- 优化的InGaAsSb SAGCM APD可以在室温下实现高性能.
- 理论分析为设计高效的SWIR探测器提供了洞察力.
- 这项工作证实了InGaAsSb对于高性能室温SWIR APD的可行性.
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