基于扫描法布里-佩罗干扰仪的长波红外高光谱成像仪
Mads Nibe Larsen1,2, Anders Løchte Jørgensen2, Victor Petrunin2
1NanoSYD, Mads Clausen Institute, University of Southern Denmark, 6400 Sønderborg, Denmark.
The Review of scientific instruments
|April 14, 2025
概括
一个新的超光谱成像仪使用扫描法布里-佩罗干扰仪和热摄像头进行材料识别. 这种紧的系统实现了良好的光谱分辨率,用于分析中红外范围内的物质.
科学领域:
- 光学和光子学 在光学和光子学.
- 频谱学是一种光谱学.
- 红外技术 红外技术
背景情况:
- 超光谱成像为材料分析提供了详细的光谱信息.
- 紧而高效的光谱成像系统对于各种应用至关重要.
- 中红外光谱 (8-15微米) 对于识别分子指纹非常有价值.
研究的目的:
- 为了呈现一种新的高光谱成像器设计.
- 通过光谱分析证明其材料识别能力.
- 描述系统在中红外范围内的性能.
主要方法:
- 低级扫描法布里-佩罗干扰仪与热摄像机的集成.
- 使用一个1024 × 768像素的未冷却的微波计探测器.
- 采用通用矩阵方法进行干扰图预测.
主要成果:
- 超光谱成像仪在1250-666厘米-1 (8-15微米) 范围内工作.
- 获得的光谱分辨率介于26至39厘米−1.1.
- 对于各种物质,获得了不同的干扰图,使其能够识别.
- 矩阵方法根据腔腔长度准确预测了干扰图形状.
结论:
- 开发的超光谱成像仪是一个紧而有效的材料识别工具.
- 该系统在中红外线显示出良好的光谱分辨率.
- 一般化矩阵方法为系统性能提供了一个预测模型.
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