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Updated: May 11, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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一种合金a-Se-Te间接平板成像仪,用于提高双层X射线探测器的性能

Kaitlin Hellier1, Kellii Fusari1,2, Paul Pryor3

  • 1Electrical and Computer Engineering, University of California, Santa Cruz, 1156 High St., Santa Cruz, CA, USA, 95064.

Proceedings of SPIE--the International Society for Optical Engineering
|April 15, 2025
PubMed
概括

研究人员通过将无形 (a-Se) 与 (Te) 合金改进了双层X射线探测器. 这使得转换效率提高了30%以上,为在医学成像中更好地区分病变铺平了道路.

关键词:
检测X射线检测的X射线检测无形是无形的.双层探测器的检测器平面面板探测器检测器间接探测器间接探测器

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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