仪器响应函数的建模,验证和应用,以单颗粒ICP-MS的混合Poisson分布的形式
Xinli Yang1,2, Hongwu Li1,2, Dexing Li1
1CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, PR China.
Analytical chemistry
|April 22, 2025
概括
单粒子感应合等离子体质谱法 (spICP-MS) 准确地确定纳米粒子的大小和度. 本研究引入了一个强大的仪器响应函数 (IRF),以提高纳米粒子大小分布 (PSD) 和粒子数度 (PNC) 的精度.
科学领域:
- 分析化学 分析化学
- 材料科学 材料科学 材料科学
- 纳米技术纳米技术
背景情况:
- 单粒子感应合等离子体质谱 (spICP-MS) 对于悬浮中纳米粒子的表征至关重要.
- 精确的事件强度分布 (EID) 采集和建模对于提高spICP-MS功能和测量精度至关重要.
- 由于信号扩大,现有的方法在精确确定粒子大小分布 (PSD) 和粒子数度 (PNC) 方面面临挑战.
研究的目的:
- 探索导致spICP-MS事件强度分布 (EID) 扩大因素.
- 开发和验证一个强大的仪器响应函数 (IRF) 以改进纳米粒子表征.
- 提高纳米粒子,包括混合物和聚合物PSD和PNC测量的准确性.
主要方法:
- 建立了一个混合波桑分布作为仪器响应函数 (IRF),以将PSD与EID相关联.
- 使用蒙特卡洛模拟,量化和纠正因粒子巧合引起的EID尾巴.
- 将IRF解卷应用于回收的EID,用于高保真PSD测定,并通过传输电子显微镜 (TEM) 验证.
主要成果:
- 通过使用开发的IRF,在各种操作条件下成功将PSD与EID关联起来.
- 实现了高保真度PSD恢复,将金纳米颗粒 (AuNPs) 的尺寸分辨率提高到大约7nm.
- 证明了IRF解卷的成功应用,用于测量纳米粒子聚合物和解决聚合数.
结论:
- 基于混合波桑分布的开发的IRF显著提高了spICP-MS的PSD和PNC测量的准确性.
- IRF解卷有效地纠正了EID扩展,使单分散和混合纳米粒子样本的精确表征成为可能.
- 这种先进的spICP-MS技术提高了纳米粒子混合物和聚合物的高通量量化.
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