在强力循环负荷下对PLC光学分割器的响应分析
Lianqiong Jiang1,2, Yu Zheng1, Ke Zeng1
1State Key Laboratory of Precision Manufacturing for Extreme Service Performance, College of Mechanical and Electrical Engineering, Central South University, Changsha 410083, China.
Micromachines
|April 26, 2025
概括
平面光波电路 (PLC) 光学分离器在力循环下在光纤阵列-芯片关节发生损伤. 实时光学监控揭示了这个弱点,这对于提高分离器可靠性至关重要.
科学领域:
- 光学工程是指光学工程.
- 材料科学 材料科学 材料科学
- 机械工程 机械工程
背景情况:
- 平面光波电路 (PLC) 光学分离器是光学网络中的关键组件.
- 在机械应力下了解它们的故障机制对于可靠性至关重要.
研究的目的:
- 在力循环下调查PLC光学分离器的损坏现象和故障机制.
- 建立一个在线实验平台,用于研究光学和机械反应.
主要方法:
- 开发了一个在线测试实验平台,用于力循环测试.
- 实时监控光学性能参数 (例如插入损失).
- 分析了机械反应并确定了弱点.
主要成果:
- 八通道输出光纤阵列-PLC芯片粘合粘合关节是最弱的区域.
- 强力循环,特别是卸载,会导致插入损失 (IL) 的突然波动.
- 实时光学监测反映了弱点区域的局部变形和损伤.
结论:
- 在力循环下识别了PLC光学分离器的关键弱点.
- 证明了光学性能和机械损坏之间的相关性.
- 为提高PLC光学分离器的长期可靠性提供了见解.
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