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Updated: May 10, 2025

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基于斑点的传输和暗场成像用于用实验室X射线源进行材料分析

Diego Rosich1, Margarita Chevalier2, Tatiana Alieva3

  • 1Physics Institute of Cantabria (IFCA-CSIC-UC), Av. de los Castros s/n, 39005 Santander, Spain.

Sensors (Basel, Switzerland)
|April 26, 2025
PubMed
概括

基于斑点的X射线传输 (T) 和暗场 (DF) 成像增强了材料分析. 从T图像的吸收系数是普遍的材料歧视,而DF图像提供补充的见解.

关键词:
基于X射线斑点的成像成像技术暗场成像 - 暗场成像实验室来源 实验室来源材料分析 材料分析多模式的X射线成像技术

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