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Updated: May 9, 2025

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM

Published on: June 16, 2016

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对于强度衍射断层扫描中的圆形LED阵列的高效失调校正

Ruizhi Zhu, Wenjie Zou, Runnan Zhang

    Optics letters
    |May 1, 2025
    PubMed
    概括

    一种新方法纠正了强度衍射断层扫描 (IDT) 中的错位,提高了3D折射率重建的准确性. 这种无标签显微镜技术提高了生物成像的分辨率.

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