与螺旋扫描路径的相关性指导扫描用于AFM以纠正实时补偿图像扭曲的螺旋扫描路径
Liansheng Zhang1, Yongyun Liang2, Wenbo Xia2
1Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei, Anhui, China.
Journal of microscopy
|May 7, 2025
概括
一种新的螺旋扫描路径方法显著提高了原子力显微镜 (AFM) 图像质量,通过减少由压电驱动器漂移引起的扭曲. 这种方法提高了长期,高分辨率成像应用的测量精度.
科学领域:
- 原子力显微镜 原子力显微镜
- 纳米技术纳米技术
- 表面科学是一门学科.
背景情况:
- 原子力显微镜 (AFM) 的图像质量通常会因扭曲而降低.
- 压电驱动器的歇斯底里,爬行和漂移是这些扭曲的主要原因.
- 在AFM中精确的测量受到图像工件的损害.
研究的目的:
- 为AFM引入一种新的螺旋扫描路径方法.
- 为了弥补AFM扫描期间的实时扭曲.
- 为了提高AFM图像的精度和质量.
主要方法:
- 一种使用块作为最小扫描单元的螺旋扫描路径方法.
- 在相邻块之间重叠的扫描部分,用于实时扭曲计算.
- 一种基于扫描图像的扭曲校正评估方法.
主要成果:
- 螺旋扫描方法在整个扫描过程中显示出强大的块相关性.
- 与传统方法相比,漂移积累显著减少.
- 在600像素宽的图像中实现了94.9%的扭曲降低.
结论:
- 拟议的螺旋相关扫描方法有效地改善了AFM图像扭曲校正.
- 这种方法比传统的扫描技术有了显著的进步.
- 适用于原子力显微镜中的长期精确扫描.
更多相关视频
09:20Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy Conpokal on Live Cells
Published on: August 11, 2020
6.8K
09:45Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
9.6K
相关概念视频
01:08Atomic Force Microscopy
3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K
01:07Scanning Electron Microscopy
4.2K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Fundamental Principles
Accelerated...
4.2K