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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 16, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

使用基于AFM的技术在2D材料中可视化间歇效应.

Karmen Kapustić¹, Cosme G Ayani¹, Borna Pielić²

¹Center for Advanced Laser Techniques, Institute of Physics, Bijenička Cesta 46, 10000 Zagreb, Croatia.

The journal of physical chemistry letters

|May 7, 2025

概括

研究人员使用原子力显微镜 (AFM) 在二维材料中绘制硫间隔图,揭示了无真空电子和光学性能的变化. 这种方法提供了一种更快,更容易获得的方法来研究和定制先进的材料.

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Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

Published on: March 24, 2019

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

相关实验视频

Last Updated: May 16, 2025

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

Published on: March 24, 2019

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

科学领域:

材料科学材料科学材料科学
表面科学是一门学科.
纳米技术纳米技术

背景情况:

间隙修改二维材料的电子,光学和结构性质,例如过渡金属二二基化物.
传统的研究间歇的方法,如超高真空技术,是耗时的,昂贵的,并且空间有限.

研究的目的:

利用基于原子力显微镜 (AFM) 的技术,在MoS₂/石墨烯/Ir(111) 中硫间隔过程中可视化局部结构和电子变化.
证明AFM技术在映射间隔现象方面的有效性,并为定制二维材料属性提供见解.

主要方法:

原子力显微镜 (AFM) 用于地形,相位成像和机械测量.
凯尔文探针力显微镜 (KPFM) 分析表面潜力和工作功能的变化.
光诱导力显微镜 (PIFM) 检测光学响应的变化.

主要成果:

AFM地形显示了由于硫间隔而导致的结构修改.
阶段成像和机械测试表明,间隔区域的模和粘附率降低.
KPFM显示了表面潜力和工作功能的变化,与间隙相一致.
PIFM检测到间隔区域的增强光学响应.

结论:

基于AFM的技术有效地绘制了与2D材料中插曲相关的局部结构和电子变化.
这些发现为高级应用提供了更容易获得的方法来表征和调整2D材料的特性.
该研究强调了AFM在先进材料表征和基于二维材料的技术开发方面的潜力.