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Updated: May 12, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

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使用创新的振动隔离扫描道显微镜进行高精度原子成像.

Behnam Esmaeilzadeh1, Muhammad Touqeer1, Syed Asad Maqbool1

  • 1High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, Anhui, China; University of Science and Technology of China, Hefei 230026, Anhui, China.

Ultramicroscopy
|May 9, 2025
PubMed
概括

本研究引入了一种新的非金属扫描道显微镜 (STM),具有机械隔离的扫描单元. 这种设计提高了用于先进材料研究的成像稳定性和精度.

关键词:
原子分辨率成像成像技术紧的设计 紧的设计高稳定性 高稳定性隔离扫描单元的隔离扫描单元非金属材料 不金属材料扫描道显微镜扫描道显微镜

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