相关实验视频
Updated: May 14, 2025

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
在p-GaN/InGaN/n-GaN纳米线LED中的电潜力的比较分析
Anitha Jose1, Arup K Kunti2, Nuno Amador-Mendez2
1Department of Physics, Simon Fraser University, 8888 University Drive, Burnaby, British Columbia, V5A 1S6, CANADA.
研究深紫外线纳米线LED揭示了不同纳米线 (NW) 类型之间的电气性质的显著差异. 电子全息显示,由于n-GaN段长度差异,长NWs中的3V连接电压与短NWs中的0.6V相比.
科学领域:
- 半导体物理 半导体物理
- 材料科学 材料科学 材料科学
- 光电学是指光电子产品.
背景情况:
- 深紫外发光二极管 (LED) 正在发展,特别是在使用化物半导体的纳米线 (NW) 几何学中.
- 在阵列中的单个NWLED之间,电气和光学性能的变化并未得到充分理解.
研究的目的:
- 为了研究轴向p-GaN/InGaN/n-GaN NW LED中的电位分布.
- 了解NW形态对设备性能的影响.
主要方法:
- 使用电子全息 (EH) 绘制电位分布图.
- 采用等离子体辅助的分子光束表观用于NW生长.
- 分析了光发光谱和能量散射X射线图的组成.
主要成果:
- 观察到两个同时的NW生长类型:长/薄和短/宽.
- 在两种NW类型中确定了类似的InGaN组成 (20 ± 3% In).
- 透露了~3V的内置连接电压在长NWs和~0.6V在短NWs通过EH.
结论:
- 短NWs的结电压的大幅降低归因于n-GaN段长度不足.
- 这种形态变化显著影响NWLED的电气特性.
- 了解这些变化对于优化深紫外线NWLED性能至关重要.
更多相关视频
10:42In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
Published on: June 16, 2016
09:14Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices
Published on: December 7, 2017
相关概念视频
Biasing of P-N Junction
In equilibrium, no external voltage is applied across the p-n junction. The depletion region is formed at the junction interface due to the diffusion of carriers, which leaves behind charged dopants, acceptors on the p-side, and donors on the n-side. These immobile charges create an electric field that prevents further diffusion of carriers. The related energy band...
P-N junction
MOSFET: Enhancement Mode
In their basic form, enhancement-mode MOSFETs are typically non-conductive when the gate-source voltage (Vgs) is zero. This default 'off' state means no...
Calculations of Electric Potential I
The ring is divided into infinitesimal small arcs such that point M is equidistant from all the arcs. Here, the cylindrical coordinate system is used to calculate the electric potential at point M. A general element of the arc between angles θ and θ + dθ is of the...