厚厚的a-PbO层中的机械应力诱导的缺陷
Janos Rado1, Amy Stieh1, Attila Csík2
1Physics Department, Lakehead University, Thunder Bay, ON P7B 5E1, Canada.
Materials (Basel, Switzerland)
|May 14, 2025
概括
无形氧化物 (a-PbO) 层用于X射线探测器由于热膨胀不匹配引起的压力而发生裂. 优化沉积和阻断层可以防止这种结晶和厚薄膜中的缺陷.
科学领域:
- 材料科学 材料科学 材料科学
- 医学成像物理 医学成像物理
背景情况:
- 无形氧化物 (a-PbO) 是直接转换的X射线探测器有希望的,由于低温沉积和没有信号滞后.
- 商业探测器使用无形 (a-Se) 与阻断层来管理暗电流,这种技术适用于a-PbO.
研究的目的:
- 研究压力诱导的结晶和厚厚的a-PbO层缺陷的原因.
- 提出一个解释缺陷形成的模型,并建议改进方法.
主要方法:
- 为a-PbO.开发一种压力诱导结晶模型的开发.
- 计算a-PbO.热膨胀系数的计算方法
- 分析沉积参数对热积累和结晶的影响.
主要成果:
- 在a-PbO层中的内在应力随着厚度的增加而增加,导致晶体学缺陷 (β-PbO阶段).
- 由于热膨胀导致的热力学不匹配是主要的压力来源.
- 沉积参数影响热积累,促进温度诱导的结晶.
结论:
- 在厚厚的a-PbO层中引起压力结晶导致缺陷,增加暗电流和裂.
- 消除阻塞结构中的热膨胀不匹配以及控制沉积热量是防止缺陷的关键.
- 优化的a-PbO层生长可以为先进的医疗成像探测器提供坚固,厚厚的薄膜.
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