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相关概念视频

Determination of Molar Masses of Polymers II01:27

Determination of Molar Masses of Polymers II

Polymer samples typically consist of macromolecular chains with a distribution of lengths, resulting in a range of molar masses rather than a single discrete value. Conventional descriptors such as the number-average molar mass and weight-average molar mass quantify this distribution but do not fully capture polymer behavior in solution..The viscosity-average molar mass provides a more realistic description of polymer behavior in solution because it accounts for the enhanced contribution of...

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相关实验视频

Updated: May 16, 2026

Fabrication of Large-area Free-standing Ultrathin Polymer Films
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测量薄透明聚合物薄膜上的涂层厚度的多角度平均方法.

Friederike Münch1, Benedikt Hauer1, Ingo Breunig1,2

  • 1Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany.

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|May 14, 2025
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概括

现在对聚合物薄膜上的纳米薄氧化物涂层的直线测量更加精确. 这种新方法克服了不同薄膜厚度的干扰效应,确保了准确的屏障功能评估.

关键词:
其他 其他 其他 其他 其他薄膜是一种薄膜.红外光谱学 红外光谱学在线厚度测量仪聚合物网是一种聚合物网.生产控制生产控制生产控制卷对卷涂层系统的涂层系统氧化的氧化是什么?

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相关实验视频

Last Updated: May 16, 2026

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10:08

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科学领域:

  • 材料科学 材料科学 材料科学
  • 光学工程是指光学工程.
  • 表面科学是一门学科.

背景情况:

  • 卷对卷涂层系统将纳米薄的氧化物层应用于聚合物薄膜上,以增强诸如气体和水透等屏障特性.
  • 保持精确的涂层厚度对于有效的屏障功能至关重要,需要在线质量控制.
  • 现有的红外反射光谱法受到薄,吸收较弱,厚度可变的聚合物基板干扰效应的挑战.

研究的目的:

  • 开发和验证一种新的传感原理,用于准确的纳米薄氧化物涂层厚度在聚合物薄膜上的直线测量.
  • 为了解决和克服由可变的聚合物薄膜厚度和背面反射引起的干扰效应.
  • 为了实现用于屏障应用的氧化物涂层聚合物薄膜的精确质量控制.

主要方法:

  • 开发了一种针对特定氧化物涂层吸收带的红外反射测量技术.
  • 实施了一种方法,以多个发射角度获得的干扰模式为平均,以减轻基质变化.
  • 通过对带有氧化物涂层的工业聚合物薄膜样本进行计算和测量来验证该方法.

主要成果:

  • 开发的方法有效地测量了不同基板的聚合物薄膜上的氧化物涂层厚度.
  • 实现了高精度 (nm) 和精度 (nm) 在5-100nm范围内的涂层厚度.
  • 证明了在多功能和紧的直线测量系统中实施的潜力.

结论:

  • 声学干扰测量为在聚合物薄膜上纳米级氧化物涂层的精确内线厚度测量提供了强大的解决方案.
  • 多角度冲击方法有效地弥补了基板厚度变化和背面反射.
  • 该技术适用于工业内线质量控制,确保涂层聚合物薄膜的屏障性能.