相关实验视频

Updated: May 17, 2025

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

Published on: February 5, 2017

7.4K

通过变压扫描电子显微镜推进棉纤维研究.

Fang Bai1, M Andrew Jansen2

  • 1The United States Department of Agriculture (USDA), Agricultural Research Service, Crop Genetics Research Unit, Stoneville, MS, United States.

Frontiers in plant science
|May 16, 2025
PubMed
概括

变压扫描电子显微镜 (VP-SEM) 为观察棉纤维发育提供了更快,更便宜,更准确的方法. 这种技术最大限度地减少了样品的准备和扭曲,改善了对这些关键织资源的研究.

关键词:
棉花纤维是一种纤维.纤维延长延伸的方法纤维启动的开始显微镜 显微镜是一种微观的仪器.扫描电子显微镜 (SEM) 扫描电子显微镜变压扫描电子显微镜 (VP-SEM) 的使用

更多相关视频

AFM-based Mapping of the Elastic Properties of Cell Walls: at Tissue, Cellular, and Subcellular Resolutions10:26

AFM-based Mapping of the Elastic Properties of Cell Walls: at Tissue, Cellular, and Subcellular Resolutions

Published on: July 24, 2014

12.9K
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy09:09

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Published on: August 10, 2019

9.1K

相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.0K
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.3K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
9.6K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
8.4K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
5.3K