Overview of Microscopy Techniques
Atomic Force Microscopy
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Yu Liu1, Roger Proksch1,2, Jason Bemis2
1Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States.
自动扫描探针显微镜 (SPM) 使用奖励驱动的工作流的触摸模式优化显著提高了效率和可靠性. 这种方法可以确保在各种样品和探测器中提供一致的高质量图像,减少操作员的时间和潜在的损害.
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