ZnTe

Yuke Zhao1,2, Zhenglin Jia1,2, Qianqian Lin1,2,3,4

  • 1Key Lab of Artificial Micro- and Nano-Structures of Ministry of Education of China, School of Physics and Technology, Wuhan University, Wuhan 430072, China.

概括

Telluride (ZnTe) 薄膜中的电荷载体寿命因缺陷捕获而随着光强度的提高而减少. 温度影响这些光电子材料中的载体动力学和激发性吸收.