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Updated: Jun 14, 2025

Atomically Traceable Nanostructure Fabrication
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在纳米和微尺度上进行先进制造

Ruifeng Zhang1,2, Qifeng Ruan1,3, Hao Wang4,5

  • 1Guangdong Provincial Key Laboratory of Semiconductor Optoelectronic Materials and Intelligent Photonic Systems, Harbin Institute of Technology, Shenzhen 518055, China.

Nanomaterials (Basel, Switzerland)
|June 11, 2025
PubMed
概括

微型和纳米结构具有独特的特性,与散装材料不同. 这些尺寸依赖的特性对于先进的材料应用至关重要.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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