散射近场光学显微镜在1纳米分辨率使用超低端振荡幅度的光学显微镜
Akitoshi Shiotari1, Jun Nishida2,3, Adnan Hammud4
1Department of Physical Chemistry, Fritz-Haber Institute of the Max-Planck Society, Faradayweg 4-6, 14195 Berlin, Germany.
Science advances
|June 11, 2025
概括
超低端振荡幅度s-SNOM (ULA-SNOM) 通过将近场光学与非接触式AFM相结合,实现1nm的分辨率. 这一突破使得原子尺度结构的光学成像能够超越传统的s-SNOM限制.
科学领域:
- 纳米技术 纳米技术
- 光学显微镜的使用方法
- 表面科学是一门学科.
背景情况:
- 散射式扫描近场光学显微镜 (s-SNOM) 提供了次衍射极限分辨率.
- 基于振幅调制AFM的传统s-SNOM通常可以达到10-100nm的分辨率.
- 使用s-SNOM对原子尺度结构的成像仍然具有挑战性.
研究的目的:
- 开发一种新的s-SNOM技术,用于原子级光学成像.
- 为了克服现有的s-SNOM方法的分辨率限制.
- 为了使单个原子或分子结构的光学分析.
主要方法:
- 超低尖振荡幅度 s-SNOM (ULA-SNOM) 的发展.
- 频率调制 (非接触) AFM与s-SNOM的集成.
- 在一个稳定的低温超高真空环境中运行,带有等离子体尖端.
主要成果:
- 在材料对比成像中实现了1nm的横向分辨率.
- 使用银色尖端和可见激光照明展示了ULA-SNOM.
- 在银色表面上成功拍摄了前所未有的细节,在银色表面上成像了岛.
结论:
- ULA-SNOM显著超过了传统的s-SNOM分辨率.
- 这种技术为原子尺度缺陷和分子的光学表征开辟了道路.
- 为纳米级光学光谱和成像提供了一条途径.
更多相关视频
10:25Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
16.6K
14:09High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
Published on: November 16, 2019
6.9K
相关概念视频
Imaging Biological Samples with Optical Microscopy
4.6K
Optical microscopy uses optic principles to provide detailed images of samples. Antonie van Leeuwenhoek designed the first compound optical microscope in the 17th century to visualize blood cells, bacteria, and yeast cells. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes with enhanced magnification and resolution.
In optical microscopy, the specimen to be viewed is placed on a glass slide and clipped on the stage...
In optical microscopy, the specimen to be viewed is placed on a glass slide and clipped on the stage...
4.6K
Super-resolution Fluorescence Microscopy
6.9K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
6.9K
Atomic Force Microscopy
3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K
