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Updated: May 3, 2026

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纳米印记的当前观点:材料表征的最新发展和应用.

Oleksandr Pshyk1, Olesya Nakonechna2, Emerson Coy3

  • 1Empa, Swiss Federal Laboratories for Materials Science and Technology, Ueberlandstrasse 129, 8600 Dübendorf, Switzerland.

ACS applied materials & interfaces
|June 11, 2025
PubMed
概括

纳米印技术揭示了超越硬度的先进材料特性. 本综述涵盖了探索各种材料机械行为和功能性质的新方法.

关键词:
组合材料科学 材料科学电化学接口 电化学接口功能纳米结构的功能纳米结构.机械性能 机械性能 机械性能薄膜涂层是一种薄膜涂层.

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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