揭示基诱导陷状态对p和n通道有机场效应晶体管中电荷传输的影响,通过可变温度表征

Yurii Radiev1, Tobias Wollandt2, Hagen Klauk2

  • 1Philipps-Universität Marburg, Renthof 7, 35032, Marburg, Germany.

概括

门介电体上的基组产生陷状态,减少p和n通道的有机场效应晶体管 (OFET) 中的电荷载体流动性. 这一发现挑战了现有的信念,并突出了提高OFET绩效的关键因素.

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