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Updated: Jun 16, 2025
Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Minjie Du1, Siqi Gu1, Zihan Qin1+3
1School of Cyber Science and Engineering, Southeast University, Nanjing, 211189, Jiangsu, China.+1
本研究引入了使用层次图像重建的新缺陷检测框架. 它实现了高精度和速度,不需要特定的缺陷数据,改善了工业检查.
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
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