概括
集成的干扰仪可以增强焦平面测量,增加信息容量超出简单的光强度. 这种方法允许使用干扰度焦点平面更准确地估计场景参数.
科学领域:
- 光学和光子学 在光学和光子学.
- 信息理论 信息理论
- 计算成像技术的成像
背景情况:
- 描述焦平面上的相互强度对于理解图像形成至关重要.
- 传统的辐射测量限制了从光学系统中获得的信息.
- 增加每个样本的自由度可以提高香农信息能力.
研究的目的:
- 提出和分析集成干扰仪阵列用于焦平面相互强度的表征.
- 为了证明与辐射量测量相比,增加香农信息能力的潜力.
- 使用干扰度焦点平面显示场景参数的改进估计.
主要方法:
- 开发用于干扰测量测试的采样模型.
- 使用一系列的2端口马赫-泽恩德干扰仪.
- 模拟和分析拟议系统的性能.
主要成果:
- 焦点连贯度测量增加了香农信息能力.
- 拟议的系统增加了每个尼奎斯特样本的自由度.
- 干涉度焦点平面可以更准确地估计场景参数.
结论:
- 集成干扰仪阵列为焦平面特征提供了一种新的方法.
- 干涉测量测量比辐射测量提供更高的信息容量.
- 开发的模型验证了增强的场景参数估计功能.
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