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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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相关实验视频

Updated: Jun 16, 2025

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator

Published on: January 28, 2019

基于相位移和调制比率的快速调制测量特征测量.

Jia Ai, Qican Zhang, Xianyu Su

|June 14, 2025

概括

本研究介绍了一种使用相位移和调制比率进行快速3D表面重建的快速调制测量分析技术. 该方法有效地克服了动态测量中的遮蔽和影子问题.

科学领域:

光学计量学在光学计量学
3D表面形测量 3D表面形测量
计算成像技术的成像

背景情况:

传统的形测量技术与阴影和遮作斗争,限制了它们在动态测量中的应用.
调制测量概况测量通过分析边缘调制来提高测量准确性的潜力.
快速准确的3D表面重建对于各种行业的质量控制和分析至关重要.

研究的目的:

开发和验证用于快速3D表面重建的快速调制测量分析技术.
解决现有方法关于阴影和遮蔽的局限性.
建立一个能够实时采集和处理数据的测量系统.

主要方法:

一个同轴光学测量系统是使用高速摄像机,投影仪和光束分割器设计的.
在移动的物体上投射了带有三级相位移动的垂直和水平二进制正弦格子.
一个圆柱状镜头将垂直和水平格子图像平面分开,以定义测量区域.
调制比是从两个方向捕获的边缘调制信息计算出来的.
预先建立的高度调制比率映射用于3D表面形状重建.

主要成果:

拟议的系统成功地重建了移动物体的3D表面形状.
该技术证明有效地减轻了阴影和遮问题.

更多相关视频

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

相关实验视频

Last Updated: Jun 16, 2025

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator

Published on: January 28, 2019

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

实验结果证实了开发方法的可行性和速度.

高速的数据采集和处理使得快速的3D重建成为可能.

结论:

基于相位移和调制比的快速调制测量概况测量是3D表面重建的可行和有效的技术.
开发的系统克服了传统形计的关键局限性,使动态测量成为可能.
该方法为各种应用中快速准确的3D表面分析提供了有前途的解决方案.