相关实验视频

Updated: Sep 19, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.0K

在扫描电子显微镜中,BSE检测器的电子反射系数,材料对比度和响应函数

E I Rau1, S V Zaitsev1

  • 1Department of Physical Electronics, Faculty of Physics, Lomonosov Moscow State University, Moscow 119991, Russia.

Ultramicroscopy
|June 17, 2025
PubMed
概括

在扫描电子显微镜 (SEM) 中,新的经验表达式准确地确定了电子反射散射系数 (η) 和探测器响应函数 (F). 这有助于更好地理解反向散射电子 (BSE) 信号和图像对比度在各种材料和能量之间.

关键词:
背散电子探测器是一种反向散射电子探测器.材料的对比性 材料的对比性检测器的响应功能检测器的响应功能.扫描电子显微镜扫描电子显微镜

更多相关视频

Author Spotlight: Advanced Techniques for Characterizing Tissue Mineralization in Bone Regeneration Research07:29

Author Spotlight: Advanced Techniques for Characterizing Tissue Mineralization in Bone Regeneration Research

Published on: September 27, 2024

896
Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

13.8K

相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.4K
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
5.9K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
10.8K
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
2.6K