在CEMOVIS的高分辨率的in situ冷EM重建
Johannes Elferich1, Marek Kaminek2, Lingli Kong3
1Howard Hughes Medical Institute, University of Massachusetts Chan Medical School, Worcester, MA, USA.
IUCrJ
|June 24, 2025
概括
玻璃体截面的冷电子显微镜 (CEMOVIS) 提供了一个高分辨率的成像替代方案,而不是聚焦离子束 (FIB) 削. 这种方法提供了显著更大的可图像面积,在很大程度上保持完整的分子结构,与FIB磨砂样品相比.
科学领域:
- 结构生物学 结构生物学
- 细胞生物学 细胞生物学
- 显微镜技术 显微镜技术
背景情况:
- 使用冷电子显微镜 (cryo-EM) 进行细胞和组织的高分辨率成像,需要电子透明样本 (厚度≤500nm).
- 聚焦离子束 (FIB) 研磨是制备冷电磁样品 (lamellae) 的标准,但它涉及材料损失,有限的可图像面积和离子束损伤.
- 玻璃体截面的冷电子显微镜 (CEMOVIS) 为样品制备提供了FIB削的潜在替代方案.
研究的目的:
- 评估CEMOVIS作为FIB削的替代品,用于冷-EM样本制备.
- 评估CEMOVIS提供的质量和可图像区域.
- 为了证明从CEMOVIS样本中获得高分辨率结构信息的可行性.
主要方法:
- 使用玻璃体截面冷电子显微镜 (CEMOVIS) 制备样本.
- 对玻璃体截面的分析,承认压缩,剪切和裂等潜在的损伤.
- 应用二维模板匹配用于结构重建.
主要成果:
- 通过CEMOVIS,可以将样品连续切割,与FIB粉碎的片相比,可以获得显著更多的可图像面积.
- 尽管切割引起的损伤,玻璃体部分内的分子结构在许多地区基本完好无损.
- 从Saccharomyces cerevisiae细胞中重建60S核糖体子单元的近原子分辨率是使用CEMOVIS数据实现的.
结论:
- 塞莫维斯是一种可行的FIB削替代品,用于冷-EM样本制备,在可图像面积方面具有明显的优势.
- 该技术保持了分子完整性,足以进行高分辨率的结构研究.
- 塞莫维斯扩大了细胞结构的冷电磁分析的可能性,特别是在大型成像研究中.
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