STED线

Iuliia Golovynska1, Qinglin Chen1, Yurii V Stepanov2

  • 1State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering and Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, China.

概括

胺β (Aβ) 暴露会导致线粒体碎片化和神经元中的功能障碍. 刺激排放枯竭 (STED) 显微镜显示线粒体形态和功能的显著变化,表明神经元损伤.

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