从嵌套的负有效参数单元中产生双频段共振声学元表面
Limei Hao1, Dongan Liu1, Xiaole Yan1
1College of Science, Xi'an University of Science and Technology, Xi'an 710054, China.
Materials (Basel, Switzerland)
|June 27, 2025
概括
这项研究揭示了声学元表面的负效参数如何影响成像质量. 优化的参数值和序列配置提高了声学成像设备的性能.
科学领域:
- 声学超级表面的表面.
- 波浪物理 波浪物理
- 材料科学 材料科学 材料科学
背景情况:
- 阶段梯度声学元表面在成像中显示结构依赖.
- 性能因共振单元细胞负有效参数的差异而变化.
- 图像性能和近共振的负有效参数之间的联系,特别是在多频段结构中,是研究不足的.
研究的目的:
- 调查负有效质量密度和模量对声学超表面成像质量的影响.
- 为了比较单带和双带嵌套的 metasurfaces 在串行和并行配置.
- 使用有效参数理论和局部共振特征建立一个比较模型.
主要方法:
- 开发了一种结合有效参数理论和局部共振的比较模型.
- 分析了串行和并行排列的单带和双带嵌套元表面.
- 研究了负有效参数和成像性能之间的相关性.
主要成果:
- 单带结构显示成像性能和负有效参数的绝对值之间的正相关性.
- 双带配置显示出更稳定的成像,负参数的带间差异较小.
- 系列类型的嵌套结构在反射成像中优于平行类型,尽管设计灵活性略低.
结论:
- 负参数从根本上决定了声学超表面成像.
- 这项研究为设计高性能多频段声学设备提供了理论指导.
- 了解参数频段差异对于稳定的双频段声学成像至关重要.
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