Search research articles

关于 JoVE

概览领导团队博客 JoVE 帮助中心

作者

出版流程编辑委员会范围与政策同行评审常见问题投稿

图书馆员

用户评价订阅访问资源图书馆顾问委员会常见问题

研究

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments 存档

教育

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual 教师资源中心教师网站

使用条款与条件

相关概念视频

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序

Same author

Innovative nanosensors for the detection of oral cancer biomarkers.

Clinica chimica acta; international journal of clinical chemistry·2025

Same author

Design of thin, wideband electromagnetic absorbers with polarization and angle insensitivity using deep learning.

Scientific reports·2025

Same author

Analytical formulation of spatiotemporal modulated graphene-based waveguides using Floquet-Bloch theory.

Scientific reports·2024

Same author

CRISPR-like sequences association with antibiotic resistance and biofilm formation in <i>Helicobacter pylori</i> clinical isolates.

Heliyon·2024

Same author

An analysis of retracted papers in Computer Science.

PloS one·2023

Same author

Integrated optical beam steering device using switchable nanoantennas and a reflective metalens.

Scientific reports·2023

Search research articles

相关实验视频

Updated: Sep 17, 2025

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

使用轨道角动量波的亚波长成像,由元表面产生的角度动量波.

Mohammadreza Ashrafian¹, Leila Yousefi^2,3

¹School of Electrical and Computer Engineering, University of Tehran, Tehran, 1417614411, Iran.

Scientific reports

|July 2, 2025

概括

科学家设计了一种介电超表面,以创建超越衍射极限的光束. 这一突破使得超高分辨率成像能够在显微镜和纳米技术中具有潜在的应用.

关键词:

介电元件表面的介电元件微分界限是微分的极限.拉古埃尔-高斯语的语言.轨道角运动量轨道角运动量空间频率空间频率微波长成像技术微波长成像

更多相关视频

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Published on: September 25, 2020

相关实验视频

Last Updated: Sep 17, 2025

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Published on: September 25, 2020

科学领域:

光学和光子学在光学和光子学.
材料科学材料科学材料科学

背景情况:

传统的成像受到了衍射极限的限制,将分辨率限制在光波长的一半.
这种局限性阻碍了显微镜和纳米技术等高分辨率领域的进步.

研究的目的:

设计一种能够产生光学拉盖尔-高斯 (LG) 轨道角动量 (OAM) 束的介电超表面.
为了达到超出常规衍射极限的成像分辨率.

主要方法:

设计了一种介电超表面,以精确控制光的相位和振幅.
为超分辨率成像生成高质量的LG OAM光束.
进行了全面的数值模拟来验证该方法.

主要成果:

实现了0.29倍于事件波长的成像分辨率.
证明了超高分辨率成像能力,超过了衍射极限.
拟议的方法提供了灵活性,因为它不要求成像组件之间的距离受到限制.

结论:

开发的介电超表面有效地产生LG OAM光束,用于超分辨率成像.
这种方法克服了衍射极限,为先进的成像应用提供了实际优势.
这些发现为显微镜,纳米技术和其他科学领域的增强分辨率铺平了道路.