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Updated: Sep 17, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

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基于光子平台相变材料的全光卷积神经网络

Samaneh Amiri1, Mehdi Miri2

  • 1Department of Communications and Electronics, School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran.

Scientific reports
|July 2, 2025
PubMed
概括

这项研究介绍了一种全光卷积神经网络,使用光子学来实现高效的AI. 新的设计简化了复杂性,并在数据分类任务中实现了高精度.

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相关概念视频

Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
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