由电子束辐射诱导的介电面的动态充电行为及其对多重包裹的作用
Yali Su1,2, Jiahao Liang3,4, Dongwei Chen5
1School of New Energy, Xi'an Shiyou University, Xi'an, 710065, China. sylemon@163.com.
Scientific reports
|July 2, 2025
概括
在电子束辐射下,航天器介电物达到平衡表面电位. 较高的二次电子发射产量 (Ep2) 减轻了危险的高电位,这对于航天器组件安全和微波设备性能至关重要.
科学领域:
- 太空飞船工程 太空飞船工程
- 血物理学的等离子体物理学
- 材料科学是一种材料科学.
背景情况:
- 航天器组件在复杂的等离子体环境中面临表面充电问题.
- 介电材料容易产生显著的潜在积聚.
- 了解表面潜力演变对于组件可靠性至关重要.
研究的目的:
- 量化研究在电子束辐射下介电物的表面潜在演变.
- 研究材料特性和电子能量对表面电荷的影响.
- 分析表面电位对微波器件多重封装的影响.
主要方法:
- 在连续电子束辐射下对电介质表面潜能演变的定量分析.
- 基于初始条件,初级电子能量和二次临界能量 (Ep2) 的平衡表面潜力的计算.
- 结合介电板的同轴过器的多层模拟.
主要成果:
- 介电面达到一个平衡电位,受到初始电位,电子能量和Ep2的影响.
- 在相同的条件下,Al2O3可以达到危险的-9501.01 V,而MgO在相同条件下可以达到-1632.34 V,这凸显了Ep2的重要性.
- 表面潜力影响第一个关键能量 (Ep1),影响微波器件中的多重合约值.
结论:
- 具有更高Ep2的介电材料在减轻危险的表面电荷方面更有效.
- 在Ep2以下的表面电位不足以触发静电放电.
- 这项研究为航天器介电充电行为和微波设备的工程应用提供了宝贵的见解.
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