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近场微波传感器用于芯片级别改检测

Maryam Saadat Safa¹, Shahin Tajik¹

¹Electrical and Computer Engineering Department, Worcester Polytechnic Institute, Worcester, MA 01609, USA.

Sensors (Basel, Switzerland)

|July 12, 2025

概括

这项研究引入了一种新的,无接触的方法来检测微电子系统中的硬件改. 互补分环共振器 (CSRR) 非侵入性监测电力输送网络阻抗变化,确保芯片安全.

科学领域:

电气工程电气工程
计算机工程计算机工程
材料科学材料科学材料科学

背景情况:

现代微电子系统面临着来自隐形芯片级别改攻击的重大安全风险,包括硬件木马和电路修改.
传统的改检测方法,如检查和侧通道分析,在可扩展性,准确性和适用性方面存在局限性.
现有的方法可能无法检测到微妙的物理变化或需要侵入性程序.

研究的目的:

开发一种非侵入性,无接触的方法来检测微电子系统中的物理改.
加强集成电路对硬件攻击的安全性和完整性验证.
为电子设备的物理安全提供具有成本效益和强大的解决方案.

主要方法:

使用互补分环共振器 (CSRR) 进行非破坏性材料表征.
在芯片组上部署了CSRR,以检测电力输送网络 (PDN) 中的阻抗变化.
由于改导致的PDN阻抗干扰引起的传感器散射参数的监控变化.

主要成果:

在28nmFPGA上展示了各种芯片级别改事件的检测.
展示了该方法在没有物理接触或电路激活的情况下检测微妙阻抗变化的能力.
验证了CSRRs在识别物理完整性侵犯方面的有效性.

结论:

基于CSRR的方法为微电子系统的物理完整性验证提供了强大且具有成本效益的解决方案.
这种非侵入性技术克服了传统改检测方法的局限性.
该方法提供了一种可靠的手段,以确保集成电路对硬件攻击的安全.

关键词:

互补的分环共振器 (CSRR)硬件木马硬件木马阻抗特性表征的阻抗特性表征.接近场传感器近场传感器物理层的安全性是物理层的安全性.分散参数的分散参数改检测改检测改检测

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