超分散的3D色彩共聚焦测量
Jiajun Wu1,2, Jin Yao2, An Ren1
1State Key Laboratory of Fluid Power and Mechatronic Systems, School of Mechanical Engineering, Zhejiang University, Hangzhou, 310027, China.
Advanced science (Weinheim, Baden-Wurttemberg, Germany)
|July 21, 2025
概括
一种新型的分散金属 (DML) 结合染色共聚焦显微镜实现了高精度的3D测量. 这种方法为高级应用提供亚波长轴分辨率和微米侧分辨率.
科学领域:
- 光学计量学 在光学计量学
- 纳米光子学 纳米光子学
- 3D重建的3D重建
背景情况:
- 目前使用元表面的3D重建方法面临着分辨率限制.
- 现有的视觉测量技术与高精度的3D传感作斗争.
研究的目的:
- 提出并演示使用分散金属 (DML) 的高精度3D测量方法.
- 为了克服当前3D重建技术中的分辨率限制.
主要方法:
- 分散金属 (DML) 与色彩共聚焦方法的整合.
- 工程分散用于线性响应和衍射有限的聚焦.
- 通过纵向和横向测量进行实验验证.
主要成果:
- 实现了±4μm的轴精度和0.325μm的亚波长轴分辨率.
- 证明横向分辨率超过4.38微米.
- 成功重建了一个3D USAF-1951分辨率测试图.
结论:
- 基于DML的色彩共聚焦方法可以实现高精度的3D测量.
- 这种技术显示了微观结构表征和工业检查的潜力.
- 为先进的芯片上3D光学计量学铺平了道路.
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