厚样品的复杂允许性的频率依赖性,用末端装载的圆柱形共振腔进行测试
Honglin Lu1, Chengyong Yu1, Yunpeng Zhang1
1School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China.
The Review of scientific instruments
|July 21, 2025
概括
这项研究引入了一种改进的圆柱形共振器,用于在广泛的频率范围内精确测量材料的电容性. 这种新的设计提高了操作频率,并使厚样品能够准确地确定复杂的电容性.
科学领域:
- 电气工程 电气工程
- 材料科学 材料科学 材料科学
- 电磁学 电磁学 电磁学 电磁学
背景情况:
- 准确的材料电容性表征对于各种应用至关重要.
- 传统的圆柱形共振器在工作频率范围内存在局限性.
- 需要一个多功能系统,能够测量各种材料的复杂电容性,包括厚样本.
研究的目的:
- 为允许度测量提供一个改进的末端装载圆柱体共振器系统.
- 与传统设计相比,扩大运行频率范围.
- 为了能够准确地确定厚样品的复杂电容性.
主要方法:
- 使用了一种改进的末端装载圆柱形共振器,顶部有裂,以扩大工作频率.
- 使用现场溶液方法提取样品加载前后的共振参数.
- 设计了一个可垂直调节的样品阶段,以方便样品插入.
- 在10-25 GHz频段内运行,使用TE01p模式.
主要成果:
- 实现了10-25 GHz的扩大运行频率范围.
- 获得的最大Q因子为5.84 × 10^4,确保了良好的频率选择性.
- 成功测量了包括PTFE和石英在内的厚样品的复杂导电性.
- 通过对标准介电材料的测试,验证了系统的可行性.
结论:
- 改进的共振器系统有效地在广泛的频率范围内测量材料的电容性.
- 该设计可方便对厚样品进行精确的复杂电容性表征.
- 这种方法对于理解材料的介电频率响应具有重要意义.
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