X线

James G McNally1, Christoph Pratsch1, Stephan Werner1

  • 1Helmholtz-Zentrum Berlin für Materialien und Energie, Elektronenspeicherring BESSY II, Albert-Einstein-Straße 15, 12489 Berlin, Germany.

概括

这项研究引入了一个新的框架,用于使用Mie理论来评估传输X射线显微镜 (TXM). 研究表明,TXMs目前低估了样本吸收率,这表明需要提高材料分析的定量准确性.

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