基于InSe集成波导的光学自纠正器

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Updated: Sep 14, 2025

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Yu Zhang¹, Xiaoqing Chen^1,2, Mingwen Zhang¹

¹Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, and Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an 710129 China.

|July 22, 2025

概括

我们开发了一种新的芯片自动校正器,使用集成在波导上的化 (InSe). 该设备实现了高度敏感的超快速光脉冲测量,功率要求显著降低.

科学领域:

光子学是指光子学的使用方法.
材料科学材料科学材料科学
非线性光学是非线性光学.

背景情况:

超快光脉冲的表征对于科学研究和技术应用至关重要.
集成光子设备为光学测量提供了小型化和增强的性能.
现有的集成自动校正器通常需要高光学功率,这限制了它们的实际使用.

研究的目的:

为了展示一种新的芯片上单射自动校正器.
为了利用几层化 (InSe) 的非线性特性,提高光学测量.
为了实现超快脉冲特征的高灵敏度和低功率操作.

主要方法:

在波导上集成少数层的InSe.
利用InSe的强的二次非线性来进行第二波生成 (SHG).
将SHG信号的空间强度分布映射到脉冲特征的时间域.

主要成果:

成功演示了芯片上的一次性自动校正器.
时间脉冲配置和波导模式的组索引的表征.
实现了高灵敏度 (2.4 × 10-8 W2) 与低脉冲峰值功率 (低至11mW).

结论:

与传统设备相比,InSe集成的波导自动校正器提供了更高的灵敏度和更低的功耗.
这项技术显示出对在光子集成电路中推进超快光脉冲测量具有重大前景.
在纳米光子结构中增强的光物质相互作用是设备性能的关键.

关键词:

一个人的内心.光学自动校正器是指光学自动校正器.第二个波代的第二个波代超短脉冲测量方法超短脉冲测量方法

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