h-BN,

Shantanu Saha1, Shrivatch Sankar2, Shamsul Arafin2

  • 1Department of Electrical, Electronics and Communication Engineering, GITAM School of Technology, GITAM (Deemed to be University), Hyderabad, Telangana 502329, India.

Nanotechnology
|July 22, 2025
PubMed
概括

中子辐射在六角化 (h-BN) 中产生量子点缺陷,使基于旋转的量子传感器成为可能. 这项研究强调了先进量子应用的挑战和改进.