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Updated: May 11, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
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[在全环半导体SPECT/CT系统中扫动运动对图像质量的影响:通过幻影实验进行评估]

Yoshitaka Tanaka1,2, Takashi Takeuchi1, Hiroyasu Kodama1

  • 1Department of Radiological Technology, Tohoku University Hospital.

Nihon Hoshasen Gijutsu Gakkai zasshi
|July 24, 2025
PubMed
概括

与连续扫描模式相比,StarGuide SPECT/CT系统的步骤扫描模式显著提高了空间分辨率,保持了高图像质量以实现诊断准确性.

关键词:
全环 CZT SPECT/CT 系统分子成像分子成像技术单光子发射计算断层扫描 (SPECT) 技术扫地扫地扫地扫地扫地扫地

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Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...