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Updated: Sep 14, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

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样品倾斜对原子力显微镜偏移的影响

Juan M Vazquez1, Lucas Ellis1, Stephen P Beaudoin1

  • 1Davidson School of Chemical Engineering, Purdue University, West Lafayette, Indiana 47907-2100, United States.

Langmuir : the ACS journal of surfaces and colloids
|July 25, 2025
PubMed
概括

研究了原子力显微镜 (AFM) 实验中的样品和悬臂倾斜角度. 结果表明,当样品平衡良好时,倾斜对接近接触和拉开偏移的影响最小.

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Use of Atomic Force Microscopy to Measure Mechanical Properties and Turgor Pressure of Plant Cells and Plant Tissues11:18

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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