.

Jiyan Tang1, Ao Zhang2, Weian Liu3

  • 1School of Computer Science and Engineering, Jiangsu University of Science and Technology, Zhenjiang, 212100, China.

Scientific reports
|July 27, 2025
PubMed
概括

本研究引入了一种新的双学生反向知识蒸框架 (BSDRD),用于磁表面缺陷检测. 该方法有效地识别复杂的纹理和小缺陷,优于现有技术.