:

Cecilia Vivarelli1, Eugenio Mattei2, Federica Ricci2

  • 1National Centre for Artificial Intelligence, HTA and Techno-Assistance, Italian National Institute of Health, 00161 Rome, Italy.

概括

一个新的物理双胞胎准确地测量了节拍器和植入式除器 (CIED) 中的电磁干扰 (EMI). 该工具有助于理解EMI机制,并提高医疗器械的安全标准.