研究探测轨迹的边界位移,考虑五轴扫描扫描测量的偏差
Peng Chen1,2, Tao Fang1,2, Zhiyong Chang1,2
1Department of Mechanical Engineering, Northwestern Polytechnical University, Xi'an 710072, China.
Micromachines
|July 30, 2025
概括
五轴扫描扫描测量解决了复杂的部件评估. 本研究介绍了轨迹受约束的部门效应,以减轻边界位移,并提高采样点的准确性,以可靠地评估加工质量.
科学领域:
- 计量学和测量科学 计量学和测量科学
- 机械工程 机械工程
- 制造业 制造技术 制造技术
背景情况:
- 五轴扫描扫描为复杂的几何形状提供了高效率.
- 模型对工件的偏差会导致边界位移,影响采样点的采集.
- 不准确的采样损害了加工质量评估.
研究的目的:
- 在五轴扫描中分析边界位移.
- 为了定义探头轨迹的受约束部门.
- 介绍和解释轨迹受约束的部门效应.
主要方法:
- 在五轴扫描中分析采样原理.
- 探头轨迹的受约束部门的定义.
- 发展轨迹受制于部门效应概念的发展.
主要成果:
- 轨迹受约束的部门效应量化了对扫描边界的偏差影响.
- 对单个和多个补丁进行边界位移和采样点采集分析.
- 了解这种效应有助于减少采样点采集错误.
结论:
- 轨迹受约束的部门效应对于理解五轴扫描错误至关重要.
- 提供了实用建议,以尽量减少对采样完整性的偏差影响.
- 这项研究提高了复杂零件计量学的准确性和可靠性.
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