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在双线性光学采样测距系统中分析强度噪声

Yuetang Yang, Jinxu Zhang, Liheng Shi

|July 30, 2025

概括

噪声强度限制双距离 (DCR) 精度. 这项研究模拟了噪声的影响,并提出了缓解策略,将范围精度提高到0.12μm,以更好地测量绝对距离.

科学领域:

光学和光子学在光学和光子学.
计量学计量学计量学
精密工程精密工程是指精密的工程.

背景情况:

双测距 (DCR) 是一个关键的绝对距离测量技术.
实际的DCR系统由于噪声强度而面临精度限制.
了解噪声源对于提高DCR性能至关重要.

研究的目的:

为线性光学采样 DCR 系统中强度噪声开发一个全面的理论模型.
调查硬件和算法参数对距离精度的影响.
提出减轻噪声和提高DCR精度的方法.

主要方法:

建立了一个由两个部分组成的理论模型,分析硬件和算法参数对信号噪声比 (SNR) 和距离精度的影响.
设计并进行实验以验证理论模型.
开发了一个方案来解决光二极管探测器和问题.

主要成果:

通过实验比较验证了理论噪声模型.
通过减轻探测器和,在2ms的刷新速率下达到0.12μm的距离精度.
为评估DCR系统噪声性能提出了新的评估标准.

结论:

开发的理论模型准确地描述了DCR系统中的强度噪声效应.
减轻光二极管探测器和度可以显著提高距离精度.
该研究为设计具有提高噪声免疫性和精度的先进DCR系统提供了基础的见解.

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