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Updated: Sep 13, 2025

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用于半导体的特定材料超高分辨率光成像的倒置涂料

Uidon Jeong1, Doory Kim1,2,3,4

  • 1Department of Chemistry, Hanyang University, Seoul, 04763, Republic of Korea.

Advanced materials (Deerfield Beach, Fla.)
|August 4, 2025
PubMed
概括

一种新的无标签的反向点积累用于纳米尺度地形成像 (PAINT) 方法使厚厚,不透明的无机材料的纳米成像成为可能. 这一突破克服了半导体晶片分析和缺陷检查的局限性.

关键词:
绘画成像成像的绘画.检查 检查 检查 检查 检查计量学 计量学 计量学 计量学半导体 半导体 半导体超高分辨率的光显微镜.

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