寿,

Ian Costanzo1, Devdip Sen1, John McNeill1

  • 1Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, Worcester, MA 01609 USA.

IEEE journal of solid-state circuits
|August 4, 2025
PubMed
概括

这项研究引入了一种新的偏移免疫技术,用于精确的发光寿命测量,这对于精确的透皮氧监测至关重要. 与基于强度的方法相比,该方法提供了优越的脱氧读数.