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Updated: Jun 17, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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在中模拟电子动态,这种动态是由高强度的femtosecondX射线驱动的

Sebastian Cardoch1, Nicusor Timneanu1

  • 1Department of Physics and Astronomy, Uppsala University, Box 516, SE-751 20 Uppsala, Sweden.

Structural dynamics (Melville, N.Y.)
|August 4, 2025
PubMed
概括

来自自由电子激光器的高强度X射线会影响衍射. 模拟揭示了电离化动态和电子损伤机制,改善了对先进结构确定性的理解.

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